Is it possible to translate the radiometric_uncertainty in the S<b>_quality_<vv>.nc to per pixel uncertainties? And if so, how do I do this, for the S-channels in particular?
Below an example of the S1_radiometric_uncertainty_an variable in the S1_quality_an.nc file. How should I interprete this information?
Thank you, the MapnoiS3 tool seems to work fine.
However, after installation only ADF L1 files are available for SLSTR-A. Where can we find ADF L1 product files for SLSTR-B?